Help to diagnose a SMART error message

Issues related to hardware problems
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tacomel
Posts: 3
Joined: 2007/02/06 05:01:49

Help to diagnose a SMART error message

Post by tacomel » 2008/01/24 03:04:55

Today I received an e-mail alert that Current_Pending_Sector was 1 for one of my hard drives. Most of the advice I found for this condition centered on "replace the drive." After reading the FAQ/Howto on the sourceforge site I ran a "long" self-test and the results are posted below (still showing "passed"). Based on this should I replace the drive immediately or simply be on the lookout for further problems?

Also, now the Current_Pending_Sector problem shows every half hour in the syslog, but it is not e-mailing me anymore. Would I be correct in assuming that, if this increased to 2 or more, it would again e-mail me to alert me of the issue?

By the way - this disk is one half of a software RAID-1 mirror, hooked directly to the motherboard (no 3ware or similar cards in front).

Thanks in advance for any advice.

# smartctl -d ata -a /dev/sdd
smartctl version 5.33 [x86_64-redhat-linux-gnu] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0MUJDSP517853
Firmware Version: CR100-10
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed Jan 23 20:47:25 2008 CST

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (8960) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 153) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 10
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 7232
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 12
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 3869
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 2
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 12
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 65536
188 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
190 Unknown_Attribute 0x0022 072 062 000 Old_age Always - 28
194 Temperature_Celsius 0x0022 154 124 000 Old_age Always - 28
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 685558318
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 3868 -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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